Manuals & Procedures

FEI HELIOS 5CX DUAL BEAM (SCANNING ELECTRON MICROSCOPE / FOCUSED ION BEAM)

Ancillary Equipment

Quick Loader & CryoMat Loader

Oxford Instruments UltimMax 100 detector & Oxford Instruments Ultim Extreme 100 detector

Oxford Instruments Symmetry EBSD

Nanometer Pattern Generation System (NPGS), an electron-beam lithography system

FEI TECNAI F20 TRANSMISSION ELECTRON MICROSCOPE (TEM)

Ancillary Equipment

Bruker Quantax 200 Energy Dispersive X-Ray Spectrometer with XFlash 6T/30 SDD (30mm2 active area)

FEI Vitrobot

Gatan Turbo Pumping Station Model 655

Gatan Single Tilt Liquid Nitrogen Cryo Transfer Holder Model 626

Gatan Model 1905 Temperature Controller

Gatan Single Tilt Heating Straining Holder Model 672

TESCAN VEGA 3 SCANNING ELECTRON MICROSCOPE

HORIBA SCIENTIFIC LabRAM HR EVOLUTION RAMAN SPECTROMETER / AIST-NT ATOMIC FORCE MICROSCOPE

QUORUM TECHNOLOGIES GLOCUBE GLOW DISCHARGE SYSTEM

SAMDRI 795 CRITICAL POINT DRYER

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