Manuals & Procedures
FEI HELIOS 5CX DUAL BEAM (SCANNING ELECTRON MICROSCOPE / FOCUSED ION BEAM)
Ancillary Equipment
Quick Loader & CryoMat Loader
Oxford Instruments UltimMax 100 detector & Oxford Instruments Ultim Extreme 100 detector
Oxford Instruments Symmetry EBSD
- Oxford Instruments Symmetry EBSD Brochure
- Oxford Instruments Transmission Kikuchi Diffraction Application Note
Nanometer Pattern Generation System (NPGS), an electron-beam lithography system
- More up-to-date imformation at https://www.jcnabity.com/
FEI TECNAI F20 TRANSMISSION ELECTRON MICROSCOPE (TEM)
- FEI Tecnai F20 Alignments Document
- FEI Tecnai F20 Column Description Document
- FEI Tecnai F20 Modes Document
- FEI Tecnai F20 User Interface Document
Ancillary Equipment
Bruker Quantax 200 Energy Dispersive X-Ray Spectrometer with XFlash 6T/30 SDD (30mm2 active area)
- Bruker Quantax EDS User Manual
- Bruker Introduction to EDS Analaysis
- Bruker Quantax Feature User Manual
FEI Vitrobot
Gatan Turbo Pumping Station Model 655
Gatan Single Tilt Liquid Nitrogen Cryo Transfer Holder Model 626
Gatan Model 1905 Temperature Controller
Gatan Single Tilt Heating Straining Holder Model 672
TESCAN VEGA 3 SCANNING ELECTRON MICROSCOPE
HORIBA SCIENTIFIC LabRAM HR EVOLUTION RAMAN SPECTROMETER / AIST-NT ATOMIC FORCE MICROSCOPE
- HORIBA SCIENTIFIC LabRAM HR EVOLUTION RAMAN SPECTROMETER MANUAL
- HORIBA SCIENTIFIC Introduction to Raman Imaging Technical Note RA-05
- HORIBA SCIENTIFIC DuoScan Imaging Technical Note RA-04
- AIST AFM OmegaScope-user's_manual-06.01.2013
- AIST AFM SmartSPM_2013_01_en_he001
- AIST AFM SmartSPM_2013_02_en_he002
- AIST AFM TERS Probes-SB-G and-SB-S-Preliminary-June-16-2015
QUORUM TECHNOLOGIES GLOCUBE GLOW DISCHARGE SYSTEM
SAMDRI 795 CRITICAL POINT DRYER
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