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Instruments

The E. M. Facility is equipped with transmission and scanning electron microscopes, a scanned probe microscope, and ancillary equipment.

Instrument Scheduling

JEOL JEM 1010 transmission electron microscope.JEM-1010 TEM

  • 40 KV to 100KV TEM
  • Side entry goniometer stage, two specimens
  • Tilt to +/- 60º
  • High contrast objective (FL=5mm)
  • Point resolution = 0.45nm, Lattice resolution = 0.2nm
  • Bright and dark field imaging
  • Selected area and microbeam diffraction
  • Gatan cold trap and Gatan Bioscan CCD camera.
  • Gatan Cryo-transfer system
  • User notes for JEOL 1010

 

 

 

FEI Company Tecnai F20ST FEG TEM (field emission gun transmission electron microscope).Tecnai F20ST TEM FEG

  • 80 KV to 200 KV TEM
  • Schottky Field emitter
  • High maximum beam current (> 100 nA)
  • High current in probe (0.5 nA or more in 1 nm probe)
  • Small energy spread (0.7 eV or less)
  • Point resolution = 0.24nm, Lattice resolution = 0.1nm
  • High resolution objective lens FL = 1.7mm
  • High tilt (40º) and large field of view
  • Fully computer-controlled, eucentric side-entry, high-stability CompuStage
  • Maximized tilts for any X, Y, Z, a, b combination
  • Low-background double-tilt holder
  • Heating-straining stage
  • Drift < 0.5 nm/minute with a standard holder
  • AMT CCD digital camera - 1024X1024 side mount, 2048X2048 bottom mount 
  • Integrated EDAX Si(Li) 30mm2 Super Ultra Thin Window detector (136ev resolution).
  • User Notes for Tecnai F20

 

FEI Company, XL-30 ESEM-FEG (field emission gun environmental scanning electron microscope).XL-30 ESEM FEG

  • Field emission gun environmental SEM - High brightness, very small spot size. 0.2 - 30 KV.
  • Resolution: 2nm @ 30KV in high vacuum or 10mBar water vapor, 5 nm @1 KV.
  • Gaseous SE and BSE detectors for low vacuum imaging.
  • Viewing of uncoated samples due to charge neutralization in low vacuum mode.
  • Pressures to 10 Torr - hydrated samples are stable in environmental chamber with Peltier-cooled stage (to -20º from ambient).
  • Stage automation (X, Y, Z, rotation). Tilt from -15º to +75º.
  • TV scan rate plus 4 user preset slow scan speeds.
  • HKL, Inc. EBSD system with digital detector system. Details of an older system we built are given on the EBSP page.
  • X-ray microanalysis with Edax light element Si(Li) detector.
  • Nabity direct write E-beam lithography system.
  • User Notes for XL-30 and attachments.

 

WITEC CRM200 CONFOCAL RAMAN MICROSCOPEWITec CRM200 Raman confocal microscope

  • high resolution 2D Raman Imaging at fixed wavenumbers ,
  • x-y, x-z, y-z scans (up 1024 x 1024 pixels)
  • acquisition of complete Raman spectra at every pixel (mapping)
  • acquisition of Raman spectra at selected areas
  • confocal microscopy in reflection
  • confocal fluorescence imaging
  • Scanning Unit piezo-driven scan platform, scan range 200 x 200 x 20 µm, with integrated capacitive sensors and closed-loop hardware linearization, linearity 0.03 %
  • Position Accuracy < 4 nm in x-y- and < 1 nm in z-direction
  • Sample Positioning x-y translation stage, with 20 x 20 mm travel, resolution < 1 µm
  • Optical Resolution diffraction limited, lateral typ. 200 nm @ 514nm excitation wavelength
  • Spectrograph f/4, 300 mm imaging spectrograph with 2 exit ports and 3 gratings (150, 600, 1800 lines/mm)
  • Detector Avalanche Photodiode Detector (APD) in single photon counting mode, darkcounts/s < 100, 70% QE @ 633 nm (typ.)
  • CCD-Camera thermoelectrically cooled CCD (Peltier cooler), 1340 x 100 pixel format, scientific grade CCD chip, 16bit camera controller, 100 kHz A/D Converter
  • User notes for WITec CRM200.

 

OPC-60 Osmium Plasma Coater.

 

Veeco/Digital Instruments SCANNING PROBE MICROSCOPE.Veeco Dimension 3100 SPM

  • Nanoscope IV controller
  • MultiMode SPM, and a Dimension 3100 SPM.
  • Atomic Force Microscopy in both contact and tapping mode
  • Phase, Lateral Force, etc.
  • Magnetic Force Microscopy
  • Kelvin Force Microscopy (MM)
  • Scanning Tunneling Microscopy (MM).
  • Accessories include a fluid cell for the Dimension 3100 and a heating system for the MultiMode.
  • User Notes for Veeco SPM.

 

Hysitron Ubi-1 Scanning Quasi-static Nanoindenter

  • Quasi-static Testing- Measure Young's modulus, hardness, fracture toughness and other
  • ScanningWear- Observe and quantify wear volumes and wear rates using in-situ imaging capability.
  • Feedback Control- Operate in closed loop load or displacement control for testing techniques such as creep and stress relaxation.
  • Piezo Automation- Automated indentation using predetermined patterns or Click Mode allows faster data collection with less operator time.
  • Motorized Staging- Automated indentation across large areas on a single sample or between multiple samples increases efficiency and decreases user intervention.
  • Active Vibration Isolation- Piezoelectric driven active vibration dampening from 0.7 to 1000Hz for faster stabilization time and optimum results.
  • User Notes for Ubi-1.

OTHER INSTRUMENTS. The E.M. Lab has a variety of other instruments for light microscopy, image analysis and processing and specimen preparation. These are briefly described here.

Last Updated: 1/10/11