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X-ray Diffraction

Scanning Electron Microscopy (SEM) is tool used to image a sample with a focused beam of electrons. Sample surface topography and composition can be observered at magnification up to ~30,000x. Using Energy dispersive X-ray spectroscopy (EDS) sample chemistry can be mesured with spot sizes of only a few microns.

For training or assistance in theSEM diffraction laboratory, please contact Devon Renock or Ed Meyer.

Scanning Electron Microscopy - Carleton Guide
Energy-Dispersive X-Ray Spectroscopy - Carleton Guide



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