Guides |
| Scanning Electron Microscopy - Carleton Guide |
| Energy-Dispersive X-Ray Spectroscopy - Carleton Guide |
X-ray Diffraction
Scanning Electron Microscopy (SEM) is tool used to image a sample with a focused beam of electrons. Sample surface topography and composition can be observered at magnification up to ~30,000x. Using Energy dispersive X-ray spectroscopy (EDS) sample chemistry can be mesured with spot sizes of only a few microns. For training or assistance in theSEM diffraction laboratory, please contact Devon Renock or Ed Meyer.
