Scanning Electron Microscopy (SEM) is tool used
to image a sample with a focused beam of electrons. Sample surface topography and composition can be observered at magnification up to ~30,000x. Using Energy dispersive X-ray spectroscopy (EDS) sample chemistry can be mesured with spot sizes of only a few microns.
For training or assistance in theSEM diffraction laboratory, please contact Devon Renock or Ed Meyer.