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E. M. Facility
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Instruments

The E. M. Facility is well equipped with transmission and scanning electron microscopes, a scanned probe microscope, and ancillary equipment. Some instruments are reserved primarily for research purposes, others for teaching activity, although all instruments are available for student use as needed.

WITEC CRM200 CONFOCAL RAMAN MICROSCOPE

  • high resolution 2D Raman Imaging at fixed wavenumbers ,
  • x-y, x-z, y-z scans (up 1024 x 1024 pixels)
  • acquisition of complete Raman spectra at every pixel (mapping)
  • acquisition of Raman spectra at selected areas
  • confocal microscopy in reflection
  • confocal fluorescence imaging
  • Scanning Unit piezo-driven scan platform, scan range 200 x 200 x 20 µm, with integrated capacitive sensors and closed-loop hardware linearization, linearity 0.03 %
  • Position Accuracy < 4 nm in x-y- and < 1 nm in z-direction
  • Sample Positioning x-y translation stage, with 20 x 20 mm travel, resolution < 1 µm
  • Optical Resolution diffraction limited, lateral typ. 200 nm @ 514nm excitation wavelength
  • Spectrograph f/4, 300 mm imaging spectrograph with 2 exit ports and 3 gratings (150, 600, 1800 lines/mm)
  • Detector Avalanche Photodiode Detector (APD) in single photon counting mode, darkcounts/s < 100, 70% QE @ 633 nm (typ.)
  • CCD-Camera thermoelectrically cooled CCD (Peltier cooler), 1340 x 100 pixel format, scientific grade CCD chip, 16bit camera controller, 100 kHz A/D Converter
  • User notes for WITec CRM200.

JEOL JEM 1010 TRANSMISSION ELECTRON MICROSCOPE.

  • 40 KV to 100KV TEM
  • Side entry goniometer stage, two specimens
  • Tilt to +/- 60º
  • High contrast objective (FL=5mm)
  • Point resolution = 0.45nm, Lattice resolution = 0.2nm
  • Bright and dark field imaging
  • Selected area and microbeam diffraction
  • Gatan cold trap and Gatan Bioscan CCD camera.
  • Gatan Cryo-transfer system
  • User notes for JEOL 1010

FEI Company Tecnai F20 FEG TEM (field emission gun transmission electron microscope).

  • 80 KV to 200 KV TEM
  • Schottky Field emitter
  • High maximum beam current (> 100 nA)
  • High current in probe (0.5 nA or more in 1 nm probe)
  • Small energy spread (0.7 eV or less)
  • Point resolution = 0.24nm, Lattice resolution = 0.1nm
  • High resolution objective lens FL = 1.7mm
  • High tilt (40º) and large field of view
  • Fully computer-controlled, eucentric side-entry, high-stability CompuStage
  • Maximized tilts for any X, Y, Z, a, b combination
  • Low-background double-tilt holder
  • Drift < 0.5 nm/minute with a standard hold
  • AMT CCD digital camera system (upper mount for wide field imaging). V
  • Integrated EDAX Si(Li) 30mm2 Super Ultra Thin Window detector (136ev resolution).
  • User Notes for Tecnai F20

FEI Company, XL-30 ESEM-FEG (field emission gun environmental scanning electron microscope).

  • Field emission gun environmental SEM - High brightness, very small spot size. 0.2 - 30 KV.
  • Resolution: 2nm @ 30KV in high vacuum or 10mBar water vapor, 5 nm @1 KV.
  • Gaseous SE and BSE detectors for low vacuum imaging.
  • Viewing of uncoated samples due to charge neutralization in low vacuum mode.
  • Pressures to 10 Torr - hydrated samples are stable in environmental chamber with Peltier-cooled stage (to -20º from ambient).
  • Stage automation (X, Y, Z, rotation). Tilt from -15º to +75º.
  • TV scan rate plus 4 user preset slow scan speeds.
  • HKL, Inc. EBSD system with new digital detector system. Details of an older system we built are given on the EBSP page.
  • X-ray microanalysis with Edax light element Si(Li) detector.
  • Nabity direct write E-beam lithography system.
  • User Notes for XL-30 and attachments.

OPC-60 Osmium Plasma Coater.

Veeco/Digital Instruments SCANNING PROBE MICROSCOPE.

  • Nanoscope IV controller electronics
  • MultiMode SPM, and a Dimension 3100 SPM.
  • Atomic Force Microscopy in both contact and tapping mode
  • Phase, Lateral Force, etc.
  • Magnetic Force Microscopy
  • Kelvin Force Microscopy (MM)
  • Scanning Tunneling Microscopy (MM).
  • Accessories include a fluid cell for the Dimension 3100 and a heating system for the MultiMode.
  • User Notes for Veeco SPM.

Hysitron Ubi-1 Scanning Quasi-static Nanoindenter

  • Quasi-static Testing- Measure Young's modulus, hardness, fracture toughness and other
  • ScanningWear- Observe and quantify wear volumes and wear rates using in-situ imaging capability.
  • Feedback Control- Operate in closed loop load or displacement control for testing techniques such as creep and stress relaxation.
  • Piezo Automation- Automated indentation using predetermined patterns or Click Mode allows faster data collection with less operator time.
  • Motorized Staging- Automated indentation across large areas on a single sample or between multiple samples increases efficiency and decreases user intervention.
  • Active Vibration Isolation- Piezoelectric driven active vibration dampening from 0.7 to 1000Hz for faster stabilization time and optimum results.
  • User Notes for Ubi-1.

OTHER INSTRUMENTS. The E.M. Lab has a variety of other instruments for light microscopy, image analysis and processing and specimen preparation. These are briefly described here.

Last Updated: 7/11/06